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Chemical quantification of atomic-scale EDS maps under thin specimen conditions

• Authors : Jia, Quanxi [Los Alamos National Lab. (LANL), Los Alamos, NM (United States)]

Subjects: 37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY; 36 MATERIALS SCIENCE material science; thin films

• Source: Microscopy and Microanalysis; 20; 06

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EDS Containment Vessel TNT Equivalence Testing.

• Authors : Crocker, Robert

• Source: Conference: Proposed for presentation at the ASME-PVP 2017 held July 16-22, 2017 in Waikoloa, HA.

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PRACTICAL UTILIZATION OF A URANIUM-CONTAINING PARTICULATE TEST SAMPLES FOR SEM/EDS AND SIMS AUTOMATED PARTICLE ANALYSIS METHOD VALIDATION

• Authors : Wellons, M.

• Source: 23; S1; Conference: Microscopy & Microanalysis 2017 Meeting

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Measurement Error in Atomic-Scale Scanning Transmission Electron Microscopy—Energy-Dispersive X-Ray Spectroscopy (STEM-EDS) Mapping of a Model Oxide Interface

• Authors : Chambers, Scott

Subjects: 37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY; 36 MATERIALS SCIENCE

• Source: Microscopy and Microanalysis; 23; 03

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Fast Atomic-Scale Chemical Imaging by STEM EDS for Study of Crystalline Materials and Dynamic Phase Transformations.

• Authors : Lu, Ping

• Source: 22; S3; Conference: Proposed for presentation at the Microscopy and microanalysis 2016 held July 25-28, 2016 in columbus, oh, usa .

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EDS Containment Vessel Explosive Test and Analysis.

• Authors : Yip, Mien

• Source: Conference: Proposed for presentation at the ASME 2016 Pressure Vessels and Piping Conference held July 17-21, 2016 in Van Couver, BC, Canada.

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Fast Atomic-scale Chemical Imaging by STEM EDS for Study of Crystalline Materials and Dynamic Phase Transformations.

• Authors : Lu, Ping

• Source: 22; S3; Conference: Proposed for presentation at the Microscopy & Microanalysis held July 24-28, 2016 in Columbus, ohio.

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Quantitative EDS of Surface Modified Pd Powders for Hydrogen Storage.

• Authors : Vitale, Suzy

• Source: Conference: Proposed for presentation at the Microscopy and MIcroanalysis 2015 held August 2-6, 2015 in Portland, OR.

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Atomic-scale EDS Mapping for Chemical Imaging and Quantification of Interdiffusion in Self-assembled Vertically Aligned Nanocomposite Thin Films.

• Authors : Pan, Wei

• Source: Conference: Proposed for presentation at the Microsocpy and Microanalysis 2015 held August 2-6, 2015 in Porland , NM.

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Measurement Error in Atomic-Scale Scanning Transmission Electron Microscopy—Energy-Dispersive X-Ray Spectroscopy (STEM-EDS) Mapping of a Model Oxide Interface

• Authors : Chambers, Scott

Subjects: 37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY stem; eds; multislice

• Source: Microscopy and Microanalysis; 23; 03

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