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Academic Journal

Detection of Si doping in the AlN/GaN MQW using Super X – EDS measurements

Subjects: [PHYS]Physics [physics]; [SPI]Engineering Sciences [physics]

  • Source: ISSN: 0968-4328 ; Micron ; https://hal.archives-ouvertes.fr/hal-03118767 ; Micron, Elsevier, 2020, 134, pp.102864. ⟨10.1016/j.micron.2020.102864⟩.

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