Search Results

Book Review: Readings in Information Retrieval. K. Sparck Jones, P. Willet (Eds.)

• Authors : Sebastiani, Fabrizio

Subjects: info:eu-repo/classification/acm/H.3.3 Information Search and Retrieval

• Source: In: The Computer Journal, 41, n. 4 (1998), 280-281. Document n. IEI-B5-04, 1998.

Record details

Introduction: Special issue on the first international workshop of the ERCIM working group on formal methods for industrial critical systems, St. Hugh's College, Oxford, March 19, 1996 - Selected papers. Stefania Gnesi, Diego Latella (eds.).

• Authors : Gnesi, Stefania; Latella, Diego

Subjects: Formal methods; info:eu-repo/classification/acm/D.2.4 Software/Program Verification

• Source: In: Formal Methods in System Design, vol. 12, n. 2 (1998), 123-124. Kluwer, 1998. Document n. IEI-B5-09, 1998.

Record details

Research Ideas FMICS-AVoCS 2016

• Authors : Ter Beek, Maurice H.; Gnesi, Stefania; Knapp, Alexander

Subjects: Formal Methods; Critical Systems; Automated Verification Techniques

• Source: Research Ideas FMICS-AVoCS 2016 (ISTI-CNR, Pisa, Italy, 26-28 September 2016), Technical report, 2016.

Record details

GaAs Sub-Micron and Nano Islands by Droplet Epitaxy on Si

• Authors : Somaschini, C.; Bietti, S.; Koguchi, N.

Subjects: Droplet Epitaxy; GaAs/Si; TEM-EDS

• Source: In: ECOSS-26 - 26th European Conference on Surface Science (Parma (Italy), 30 Aug. - 4 Sept. 2009). Abstract, p. 193. European Physical Society, 2009.

Record details

Influence of hydrogen on the structural stability of annealed ultrathin Si/Ge amorphous layers

• Authors : Frigeri, Cesare; Nasi, Lucia; Serenyi, M.

Subjects: Si/Ge; Amorphous multilayers; TEM-EDS

Record details

Proceedings of the 18th International Software Product Line Conference, Volume 2

• Authors : Gnesi, Stefania; Fantechi, Alessandro; Ter Beek, Maurice H. ...

Subjects: Software Product Lines; info:eu-repo/classification/acm/D.2.13 Software Engineering. Reusable Software

• Source: In: 18th International Software Product Line Conference, Volume 2: Companion Volume for Workshops, Demonstrations and Tools. Editorial, vol. 2 pp. 1 - 150. Stefania Gnesi, Alessandro Fantechi, Maurice

Record details

Proceedings of SPLC 2017

• Authors : Ter Beek, Maurice H.; Cazzola, Walter; Diaz, Oscar

Subjects: Software Product Lines; info:eu-repo/classification/acm/D.2.13 SOFTWARE ENGINEERING. Reusable Software

• Source: In: 21st International System & Software Product Line Conference. Editorial, vol. B pp. vi - vi. ACM, 2017.

Record details

Advanced infrared technology and applications 2015

• Authors : Moroni, Davide; Raimondi, Valentina; Sakagami, Takahide

Subjects: Infrared imaging; Metrology; AITA

• Source: In: Measurement Science & Technology. Editorial, vol. 28 (4) article n. 40102. Special Section on Advanced Infrared Technology and Applications 2015. IOP, 2017.

Record details

Foreword

• Authors : Ter Beek, Maurice H.; Siegmund, Norbert; Schaefer, Ina

Subjects: Variability modelling; Software Product Lines; info:eu-repo/classification/acm/D.2.13 SOFTWARE ENGINEERING. Reusable Software

• Source: In: VaMoS '17 - Eleventh International Workshop on Variability Modelling of Software-intensive Systems. Editorial, pp. i - ii. ACM, 2017.

Record details

In Memoriam David Arnold (1951-2016)

• Authors : Scopigno, Roberto; Rodriguez Echavarria, Karina; (eds.), .

Subjects: 3D graphics; Cultural heritage; David Arnold

• Source: In: ACM Journal on Computing and Cultural Heritage. Editorial, vol. 10 (1) article n. 1. ACM, 2017.

Record details