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Report

Research Ideas FMICS-AVoCS 2016

Subjects: Formal Methods; Critical Systems; Automated Verification Techniques

  • Source: Research Ideas FMICS-AVoCS 2016 (ISTI-CNR, Pisa, Italy, 26-28 September 2016), Technical report, 2016.

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Conference

GaAs Sub-Micron and Nano Islands by Droplet Epitaxy on Si

Subjects: Droplet Epitaxy; GaAs/Si; TEM-EDS

  • Source: In: ECOSS-26 - 26th European Conference on Surface Science (Parma (Italy), 30 Aug. - 4 Sept. 2009). Abstract, p. 193. European Physical Society, 2009.

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Review

Proceedings of the 18th International Software Product Line Conference, Volume 2

Subjects: Software Product Lines; info:eu-repo/classification/acm/D.2.13 Software Engineering. Reusable Software

  • Source: In: 18th International Software Product Line Conference, Volume 2: Companion Volume for Workshops, Demonstrations and Tools. Editorial, vol. 2 pp. 1 - 150. Stefania Gnesi, Alessandro Fantechi, Maurice

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Review

Advanced infrared technology and applications 2015

Subjects: Infrared imaging; Metrology; AITA

  • Source: In: Measurement Science & Technology. Editorial, vol. 28 (4) article n. 40102. Special Section on Advanced Infrared Technology and Applications 2015. IOP, 2017.

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Review

Foreword

Subjects: Variability modelling; Software Product Lines; info:eu-repo/classification/acm/D.2.13 SOFTWARE ENGINEERING. Reusable Software

  • Source: In: VaMoS '17 - Eleventh International Workshop on Variability Modelling of Software-intensive Systems. Editorial, pp. i - ii. ACM, 2017.

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Review

In Memoriam David Arnold (1951-2016)

Subjects: 3D graphics; Cultural heritage; David Arnold

  • Source: In: ACM Journal on Computing and Cultural Heritage. Editorial, vol. 10 (1) article n. 1. ACM, 2017.

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