Charged particle beam system

10529,530

15/341309

November 02, 2016

There is provided a charged particle beam system in which a detector can be placed in an appropriate analysis position. The charged particle beam system (100) includes: a charged particle source (11) for producing charged particles; a sample holder (20) for holding a sample (S); a detector (40) for detecting, in the analysis position, a signal produced from the sample (S) by impingement of the charged particles on the sample (S); a drive mechanism (42) for moving the detector (40) into the analysis position; and a controller (52) for controlling the drive mechanism (42). The controller (52) performs the steps of: obtaining information about the type of the sample holder (20); determining the analysis position on the basis of the obtained information about the type of the sample holder (20); and controlling the drive mechanism (42) to move the detector (40) into the determined analysis position.

JEOL Ltd. (Tokyo, JP)

JEOL Ltd. (Tokyo, JP)

1. A charged particle beam system comprising: a charged particle source for producing charged particles; a sample holder for holding a sample; a detector for detecting, in an analysis position, a signal produced from the sample by impingement of the charged particles on the sample; a drive mechanism for moving the detector into a plurality of analysis positions; and a controller for controlling the drive mechanism, wherein, prior to performing the analysis, the controller performs the steps of: obtaining information about the type of the sample holder, determining the appropriate one of the plurality of analysis positions on the basis of the obtained information about the type of the sample holder, and controlling the drive mechanism to move the detector into the determined analysis position.

2. The charged particle beam system as set forth in claim 1 , wherein said sample holder is connected with said controller via plural signal lines, and wherein the controller obtains the information about the type of the sample holder on the basis of the state of electrical connection between the plural signal lines.

3. The charged particle beam system as set forth in claim 1 , wherein said sample holder has an information storage section in which there is stored information about the type of the sample holder, and wherein said controller obtains the information about the type of the sample holder by reading this information about the type of the sample holder from the information storage section.

4. The charged particle beam system as set forth in claim 1 , further comprising a manual control unit permitting a user to enter information about the type of said sample holder, and wherein said controller obtains the information about the type of the sample holder on the basis of the information about the type of the sample holder entered via the manual control unit.

5. The charged particle beam system as set forth in claim 1 , wherein there is further included an objective lens, wherein said controller performs the step of obtaining information about the type of the objective lens, and wherein during the step of determining said analysis position, the controller determines the appropriate analysis position on the basis of both the information about the type of the sample holder and the information about the type of the objective lens.

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